Test data compression technique using selective don't-care identification
Proceedings of the 2004 Asia and South Pacific Design Automation Conference
A cocktail approach on random access scan toward low power and high efficiency test
ICCAD '05 Proceedings of the 2005 IEEE/ACM International conference on Computer-aided design
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This paper describes a method of test data compression fora given test set using statistical encoding. In order to maximizethe effectiveness of statistical encoding, the methodfirst converts some specified input values in the test set tounspecified ones without losing fault coverage, and thenreassigns appropriate logic values to the unspecified inputs.Experimental results for ISCAS-89 benchmark circuitsshow that the proposed method can on the average reducethe test data volume to less than 25% of that required forthe original test set.Keywords: test compression, don't care identification,Huffman's algorithm, test generation