On-chip Analog Response Extraction with 1-Bit Ε Δ- Modulators

Authors:
Hao-Chiao Hong;Jiun-Lang Huang;Kwang-Ting Cheng;Cheng-Wen Wu
Affiliations:
-;-;-;-
Venue:
ATS '02 Proceedings of the 11th Asian Test Symposium
Year:
2002

Citing 0
Cited 2

A Digital Test for First-Order [Sigma-Delta] Modulators

Proceedings of the conference on Design, automation and test in Europe - Volume 1
A Level-Crossing Approach for the Analysis of RF Modulated Signals Using Only Digital Test Resources

Journal of Electronic Testing: Theory and Applications

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Abstract

Because of their relative robustness to process variation,驴-驴 modulation techniques are particularly suitablefor VLSI implementations. In this paper, we propose toemploy the 1-bit 驴-驴 modulation ADC (analog-to-digitalconverter) as the on-chip analog response extractor foranalog/mixed-signal BIST (Built-In Self-Test) applications.To validate the idea, a prototype chip with the proposedBIST circuitry has been designed and fabricated. Performancesof the BIST circuitry are validated (up to 87 dB dynamicrange), and measurement results of the circuit undertest (CUT), a 2nd-order low-pass filter, are presented.