Approaches to On-chip Testing of Mixed Signal Macros in ASICs

  • Authors:

  • R. A. Cobley

  • Affiliations:

  • School of Engineering, University of Exeter, Exeter, EX4 4QF, UK

  • Venue:
  • EDTC '96 Proceedings of the 1996 European conference on Design and Test
  • Year:
  • 1996

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Abstract

This paper initially researches the use of available low-cost analogue CMOS macros to perform simple on-chip tests on the Analogue to Digital Converter macro. The results are evaluated for these tests and then further fuller tests are undertaken. The technique of transient response testing is then applied to three CMOS analogue and mixed submacros to provide more comprehensive test results.