Test Data Compression Using Don't-Care Identification and Statistical Encoding

Authors:
Seiji Kajihara;Kenjiro Taniguchi;Irith Pomeranz;Sudhakar M. Reddy
Affiliations:
-;-;-;-
Venue:
DELTA '02 Proceedings of the The First IEEE International Workshop on Electronic Design, Test and Applications (DELTA '02)
Year:
2002

Citing 0
Cited 3

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Abstract

This paper describes a method of test data compression for a given test set using statistical encoding. In order to maximize the effectiveness of statistical encoding, the method first converts some specified values of test vectors to unspecified ones without losing fault coverage, and then reassigns appropriate logic values to the unspecified inputs. Experimental results for ISCAS-89 benchmark circuits show that the proposed method could reduce test data volume to less than 40% of the original test sets.