Single fault masking logic designs with error correcting codes

Authors:
Jien-Chung Lo
Affiliations:
-
Venue:
DFT '95 Proceedings of the IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems
Year:
1995

Citing 3
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Abstract

Triple modular redundancy (TMR) has been the most popular method in reliable logic designs due to a single fault masking capability. However, the reliability of a TMR design can be improved only by enhancing the reliabilities of the components. This paper examines the use of error correcting codes in reliable logic design. The goal is to provide an equivalent single fault masking capability as that of TMR scheme. Further, by reducing the level of hardware redundancy, a higher reliability can be achieved. Design examples are given to illustrate the key issues in single fault masking logic designs with error correcting codes. Reliabilities of different single fault masking carry lookahead adder designs are also examined.