Pseudo-Exhaustive Testing of Sequential Circuits

Authors:
Bassam Shaer;Sami A. Al-Arian;David Landis
Affiliations:
-;-;-
Venue:
GLS '99 Proceedings of the Ninth Great Lakes Symposium on VLSI
Year:
1999

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Abstract

A new sequential circuit partitioning algorithm is introduced which enhances pseudo-exhaustive testing. Our PIFAN algorithm is based on an analysis of Primary Input cones and FANout values. Results are presented which show that PIFAN offers significant reductions in hardware overhead and test time when compared to alternative partitioning algorithms.