An Organizational Memory Information Systems Success Model: An Extension of DeLone and McLean's I/S Success Model

Authors:
Murray Jennex;Lorne Olfman;Pituma Panthawi;Yong-Tae Park
Affiliations:
-;-;-;-
Venue:
HICSS '98 Proceedings of the Thirty-First Annual Hawaii International Conference on System Sciences - Volume 1
Year:
1998

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Abstract

This paper describes an organizational memory information system (OMIS) Success Model that is based on the I/S Success Model proposed by DeLone and McLean. The current model is refined from the original through application of specific factors associated with an OMIS. The paper briefly summarizes previous research that explored effectiveness of OMIS, including a case study of a station engineering unit at a nuclear power plant, and shows that no quantitative study has been done to test the effectiveness of OMIS for a cross-section of organizations. It is proposed to test the OMIS Success Model by surveying station engineering units at nuclear power plants throughout the United States. These groups do similar tasks, but will have different kinds of organizational memory information systems. Measures for the OMIS Success Model constructs that can be included in the survey instrument are proposed. Other factors affecting the possible outcomes of the study are discussed.