Total stuct-at-fault testing by circuit transformation

  • Authors:

  • Andrea S. LaPaugh;Richard J. Lipton

  • Affiliations:

  • Department of Electrical Engineering and Computer Science, Princeton University;Department of Electrical Engineering and Computer Science, Princeton University

  • Venue:
  • DAC '83 Proceedings of the 20th Design Automation Conference
  • Year:
  • 1983

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Abstract

We present a new approach to the production testing of VLSI circuits. By using very structured design for testability, we achieve 100% single stuck-at fault coverage with under 20 test vectors and no search. The approach also detects most multiple faults.