Digital test generation and design for testability

  • Authors:
  • John Grason;Andrew W. Nagle

  • Affiliations:
  • -;-

  • Venue:
  • DAC '80 Proceedings of the 17th Design Automation Conference
  • Year:
  • 1980

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Abstract

This paper is a tutorial intended primarily for individuals just getting started in digital testing. Basic concepts of testing are described, and the steps in the test development process are discussed. A pragmatic approach to test sequence generation is presented, oriented towards ICs interconnected on a board. Finally, design for testability techniques are described, with an emphasis on solving problems that appeared during the test generation discussion.