A logic design structure for LSI testability
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Switch directed dynamic causal networks—a paradigm for electronic system diagnosis
DAC '87 Proceedings of the 24th ACM/IEEE Design Automation Conference
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Fortifying analog models with equivalence checking and coverage analysis
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This paper is a tutorial intended primarily for individuals just getting started in digital testing. Basic concepts of testing are described, and the steps in the test development process are discussed. A pragmatic approach to test sequence generation is presented, oriented towards ICs interconnected on a board. Finally, design for testability techniques are described, with an emphasis on solving problems that appeared during the test generation discussion.