A statistical method for test sequence evaluation*
DAC '75 Proceedings of the 12th Design Automation Conference
Predicting fault detectability in combinational circuits - a new design tool?
DAC '75 Proceedings of the 12th Design Automation Conference
Automatic test-generation and test-verification of digital systems
DAC '74 Proceedings of the 11th Design Automation Workshop
LSI product quality and fault coverage
25 years of DAC Papers on Twenty-five years of electronic design automation
A fault simulator for MOS LSI circuits
25 years of DAC Papers on Twenty-five years of electronic design automation
LSI product quality and fault coverage
DAC '81 Proceedings of the 18th Design Automation Conference
SALOGS-IV-A program to perform logic simulation and fault diagnosis
DAC '78 Proceedings of the 15th Design Automation Conference
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An analysis of failure modes in CMOS logic gates is presented. An example 3-input NAND gate is analyzed in detail and the ramifications of its failure modes are discussed.