Design aids and hardware testing of microprocessor system circuit packs

  • Authors:

  • J. Grason

  • Affiliations:

  • Telephone Laboratories, Inc., Holmdel, New Jersey

  • Venue:
  • Proceedings of the Symposium on Design Automation and Microprocessors
  • Year:
  • 1977

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Abstract

In this paper the hardware testing of microprocessor system circuit packs is treated, with particular emphasis on the role of automatic design aids in this process. Specific problems of implementing these tests on automatic test machines are also considered. Goals and methods of testing in this context are discussed, with special attention paid to functional simulation as a design aid. Several unique problems this type of testing are discussed, including tri-state busses, dynamic RAMs, PROMs, and a poorly testable LSI DIP. Finally the role of design aids and testing in the overall circuit pack development process is discussed.