Design automation of electronics in Sweden
DAC '75 Proceedings of the 12th Design Automation Conference
A system of computer programs for efficient test generation for combinational switching circuits
DAC '74 Proceedings of the 11th Design Automation Workshop
Contest: a concurrent test generator for sequential circuits
DAC '88 Proceedings of the 25th ACM/IEEE Design Automation Conference
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It is described how a timing accurate system for logic and deductive fault simulation can be used in the forward tracing part of the D-algorithm. The logic simulation is used for the forward implication and the verification phases. The deductive fault simulator is used for D-propagation. Some results from executions of the test generation program are presented.