A Statistical Sampler for Increasing Analog Circuits Observability

Authors:
M. Negreiros;L. Carro;A. A. Susin
Affiliations:
-;-;-
Venue:
Proceedings of the 15th symposium on Integrated circuits and systems design
Year:
2002

Citing 0
Cited 1

Low Cost Analog Testing of RF Signal Paths

Proceedings of the conference on Design, automation and test in Europe - Volume 1

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Abstract

This paper presents a method to increase the observability of analog circuits through the use of a statistical sampler. This sampler acquires statistical properties of the input signal. Its main advantages are simplicity, low analog area overhead and suitability to multi-channel acquisition, as only one bit samplers are used. This qualifies it for use in a System-On-Chipenvironment. The application of the statistical sampler to the test of analog circuits in a SOC environment is presented.