A measurement-based model for workload dependence of CPU errors
IEEE Transactions on Computers - The MIT Press scientific computation series
Fault sensitivity and wear-out analysis of VLSI systems
Fault sensitivity and wear-out analysis of VLSI systems
FOCUS: An Experimental Environment for Fault Sensitivity Analysis
IEEE Transactions on Computers
Hierarchical Simulation Approach to Accurate Fault Modeling for System Dependability Evaluation
IEEE Transactions on Software Engineering
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This paper describes FAMAS-FAult Modeling via Adaptive Simulation: a software tool that models transient faults and evaluates their impact on latch error probabilities through fault injection. The tool integrates DESSIS (a device-physics-level simulator) and SPICE using an adaptive approach. The behavior of electron hole pairs is captured for semiconductor devices under ionic radiation. Changes in bias voltage due to current surge are taken into account in an iterative fashion during the process of fault model construction. Results show that in general, the adaptively simulated fault model results in higher latch error probabilities than the Messenger model under the same process and electrical conditions.