Partial Reset Methodologies for Improving Random-Pattern Testability and BIST of Sequential Circuits

• Authors:

• H. Nguyen;R. Roy;A. Chatterjee

• Affiliations:

• -;-;-

• Venue:
• VLSID '98 Proceedings of the Eleventh International Conference on VLSI Design: VLSI for Signal Processing
• Year:
• 1998