An Introduction to RF Testing: Device, Method and System
Authors:
Presenter: Jeffrey S. Kasten
Affiliations:
-
Venue:
VTS '98 Proceedings of the 16th IEEE VLSI Test Symposium
Year:
1998
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Cited
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System-on-Chip Test Architectures: Nanometer Design for Testability
System-on-Chip Test Architectures: Nanometer Design for Testability
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Abstract