Simultaneous Reduction of Dynamic and Static Power in Scan Structures
Proceedings of the conference on Design, Automation and Test in Europe - Volume 2
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Localized delay defects, like resistive shorts, resistiveopens, etc., can be effectively detected by testing the longesttestable path through each wire (or gate) in the circuit. Sucha delay test set is referred to as a longest-path-per-wire testset. ...