Built-in test for VLSI: pseudorandom techniques
Built-in test for VLSI: pseudorandom techniques
Formal Design and Verification of a Reliable Computing Platform for Real-Time Control (Phase 1 Results)
Formal Design and Verification of a Reliable Computing Platform for Real-Time Control (Phase 2 Results)
Formal Design and Verification of a Reliable Computing Platform For Real-Time Control (Phase 3 Results)
Techniques for Modeling the Reliability of Fault-Tolerant Systems With
Techniques for Modeling the Reliability of Fault-Tolerant Systems With
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This paper deals with studying the effects of bothon-line and off-line test during flight critical missionswhere safety is a major issue. The on-line test, inthis context, is a test performed on a digital airbornesystem during some specified windows in time whileit is still performing its intended task. An off-linetest is a test that is performed on the digital systemonce it is taken o.-line because of a suspected failure.Both the on-line and the off-line tests are performedduring flight. The difference between the two is thatthe off-line test can be made more effective thanan on-line test due to the longer amount of timeavailable for testing. Moreover, the off-line test maybe designed to have diagnosis and repair capabilitiesbuilt-in. Upon successful repair, the faulty processormay be reconfigured back into the system. This capabilitywill undoubtedly increase the mission reliability.