A New Method for Testing Jitter Tolerance of SerDes Devices Using Sinusoidal Jitter

  • Authors:

  • Takahiro J. Yamaguchi;Mani Soma;Masahiro Ishida;Hirobumi Musha;Louis Malarsie

  • Affiliations:

  • -;-;-;-;-

  • Venue:
  • ITC '02 Proceedings of the 2002 IEEE International Test Conference
  • Year:
  • 2002

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Abstract

This paper presents a new method for measuring jitter tolerance of a SerDes receiver using the timing misalignment between the jittered source clock and the recovered clock. A sinusoidal jitter is injected into the serial bit stream. The method derives an equation for estimating BER accurately and is 10X faster than the conventional BER test method. The accuracy and test speed of the method are verified by 2.5 Gbps and 10 Gbps-SerDes experiments.