Silicon Symptoms to Solutions: Applying Design for Debug Techniques

Authors:
Carol Pyron;Rekha Bangalore;Dawit Belete;Jason Goertz;Ashutosh Razdan;Denise Younger
Affiliations:
-;-;-;-;-;-
Venue:
ITC '02 Proceedings of the 2002 IEEE International Test Conference
Year:
2002

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Cited 2

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Abstract

Quick and accurate silicon debug is essential for short Time to Market schedules. This paper describes several actual silicon debug test cases to illustrate both the range of issues found only after silicon is available as well as the range of design for debug features used in the diagnostic process. Each test case starts with the symptoms found on the silicon and follows through to the problem definition and resolution. The debug test cases cover issues from logic and circuit errors to process issues. The designs in the test cases include Motorola's MPC7410 and MPC7450 advanced microprocessors and DSP56621 digital signal processor.