Next Generation PowerPC" Microprocessor Test Strategy Improvements

  • Authors:
  • Carol Pyron;Javier Prado;James Golab

  • Affiliations:
  • -;-;-

  • Venue:
  • ITC '97 Proceedings of the 1997 IEEE International Test Conference
  • Year:
  • 1997

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Abstract

The first PowerPC microprocessor in the new G3 generationof designs, the MPC750, incorporates new test strategyapproaches to improve the product test quality, reliability,and debug,- and to reduce the total time to market.