Design of Memories with Concurrent Error Detection and Correction by Nonlinear SEC-DED Codes
Journal of Electronic Testing: Theory and Applications
Analog Integrated Circuits and Signal Processing
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In this paper, an efficient method for constructing a class of Single Error Correcting and Double Error Detecting and All Unidirectional Error Detecting (SEC-DED-AUED) codes has been presented. The encoding/decoding algorithms proposed with this method can be implemented with a simple and faster hardware. Also, in ROM based implementation, it results in significant saving of word-length. This scheme in general, needs less or equal number of check bits.