Analyzing Statistical Timing Behavior of Coupled Interconnects Using Quadratic Delay Change Characteristics

  • Authors:
  • Tom Chen;Amjad Hajjar

  • Affiliations:
  • -;-

  • Venue:
  • ISQED '03 Proceedings of the 4th International Symposium on Quality Electronic Design
  • Year:
  • 2003

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Abstract

With continuing scaling of CMOS process, process variationsin the form of die-to-die and within-die variations become significantwhich cause timing uncertainty. This paper proposes amethod of analytically analyzing statistical behavior of multiplecoupled interconnects with an uncertain signal arrival time ateach interconnect input (aggressors and the victim). The methodutilizes delay change characteristics due to changes in relative arrivaltime between an aggressor and the victim. The results showthat the proposed method is able to accurately predict delay variationsthrough a coupled interconnect.