A two-level approach to automated conformance testing of VHDL designs

Authors:
Jean R. Moonen;Judi M.T. Romijn;Olaf Sies;Jan G. Springintveld;Loe G.M. Feijs;Ronald L.C. Koymans
Affiliations:
-;-;-;-;-;-
Venue:
A two-level approach to automated conformance testing of VHDL designs
Year:
1997

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Abstract

For manufacturers of consumer electronics, conformance testing of embedded software is a vital issue. To improve performance, parts of this software are implemented in hardware, often designed in the Hardware Description Language VHDL. Conformance testing is a time consuming and error-prone process. Thus automating (parts of) this process is essential.