Counting Two-State Transition-Tour Sequences
IEEE Transactions on Computers
Detectability of internal bridging faults in scan chains
Proceedings of the 2009 Asia and South Pacific Design Automation Conference
Ring oscillators for functional and delay test of latches and flip-flops
Proceedings of the 24th symposium on Integrated circuits and systems design
| Hi-index | 0.00 |
Abstract: Necessary and sufficient conditions for exhaustive functional tests (checking experiments) of 2-state latches are derived. These conditions are used to derive minimum-length checking experiments. The checking experiment for the D-latch is simulated using an HSpice implementation of the transmission gate latch. All detectable shorted interconnects, open interconnects, short-to-power, short-to-ground, stuck-open, and stuck-on faults are detected. A pin fault test set and a multiplexer-based test set are also simulated. These tests miss some faults detected by the checking experiment.