On bounding the delay of a critical path
Proceedings of the 2006 IEEE/ACM international conference on Computer-aided design
IEEE Design & Test
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Due to technology scaling and increasing clock rate, problems due to noise effects lead to an increase in design and test efforts and a decrease in circuit performance. This paper addresses the problem of efficiently and effectively generating two vector tests to produce the maximum ground bounce in a circuit. We have developed a branch and bound procedure that can find a good quality test for maximum ground bounce in a rather short time. Comparison of results with SPICE simulations confirms the quality of tests obtained by our procedure.