A BICS for CMOS OpAmps by Monitoring the Supply Current Peak

Authors:
J. Font;J. Ginard;R. Picos;E. Isern;J. Segura;M. Roca;E. García
Affiliations:
Departament de Física, Universitat Illes Balears, Ctra. Valldemossa, km 7.5-07122 Palma de Mallorca;Departament de Física, Universitat Illes Balears, Ctra. Valldemossa, km 7.5-07122 Palma de Mallorca;Departament de Física, Universitat Illes Balears, Ctra. Valldemossa, km 7.5-07122 Palma de Mallorca;Departament de Física, Universitat Illes Balears, Ctra. Valldemossa, km 7.5-07122 Palma de Mallorca;Departament de Física, Universitat Illes Balears, Ctra. Valldemossa, km 7.5-07122 Palma de Mallorca;Departament de Física, Universitat Illes Balears, Ctra. Valldemossa, km 7.5-07122 Palma de Mallorca;Departament de Física, Universitat Illes Balears, Ctra. Valldemossa, km 7.5-07122 Palma de Mallorca
Venue:
Journal of Electronic Testing: Theory and Applications
Year:
2003

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Abstract

We present a Built-In-Current-Sensor (BICS) based on monitoring a signature of the supply current peak of CMOS OpAmps using the oscillation-test-strategy. The BICS takes a weighted sample of the current through two OpAmp current branches and monitors a signature of the peak value under oscillation. Two current-based comparators and some digital circuitry are used to provide a pass/fail flag. Simulation results demonstrate a high defect coverage with a very small impact both on the OpAmp nominal operation and the area overhead.