Pattern recognition based methods for ic failure analysis

Authors:
Andrzej Jozef Strojwas
Affiliations:
-
Venue:
Pattern recognition based methods for ic failure analysis
Year:
1982

Citing 0
Cited 2

Design for manufacturability and yield

DAC '89 Proceedings of the 26th ACM/IEEE Design Automation Conference
CMU-CAM system

DAC '85 Proceedings of the 22nd ACM/IEEE Design Automation Conference

Quantified Score

Hi-index	0.00

Visualization

Abstract