Empirical model-building and response surface
Empirical model-building and response surface
Statistical Design of Integrated Circuits
Statistical Design of Integrated Circuits
Pattern recognition based methods for ic failure analysis
Pattern recognition based methods for ic failure analysis
A macromodelling approach for simulation of vlsi circuits (computer-aided design)
A macromodelling approach for simulation of vlsi circuits (computer-aided design)
Design of repairable and fully diagnosable folded PLAs for yield enhancement
DAC '90 Proceedings of the 27th ACM/IEEE Design Automation Conference
DAC '94 Proceedings of the 31st annual Design Automation Conference
Enhanced network flow algorithm for yield optimization
DAC '96 Proceedings of the 33rd annual Design Automation Conference
Design for manufacturability in submicron domain
Proceedings of the 1996 IEEE/ACM international conference on Computer-aided design
Yield modeling and BEOL fundamentals
Proceedings of the 2001 international workshop on System-level interconnect prediction
A Quantitative Approach to Nonlinear Process Design Rule Scaling
ARVLSI '99 Proceedings of the 20th Anniversary Conference on Advanced Research in VLSI
Routing architecture exploration for regular fabrics
Proceedings of the 41st annual Design Automation Conference
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This tutorial focuses on the design strategies for VLSI circuits that are aimed at achieving manufacturable, high-yielding chips. We review the current status of statistical design methodologies based upon statistically-valid modeling and process characterization approaches. Both parametric and functional yield maximization strategies are covered. This tutorial argues that by providing a better starting point for manufacturing, the profitability and competitiveness can be significantly improved.