Polarization-Based Material Classification from Specular Reflection
IEEE Transactions on Pattern Analysis and Machine Intelligence
Constraining Object Features Using a Polarization Reflectance Model
IEEE Transactions on Pattern Analysis and Machine Intelligence
Color Reflectance Modeling Using a Polychromatic Laser Range Sensor
IEEE Transactions on Pattern Analysis and Machine Intelligence - Special issue on interpretation of 3-D scenes—part II
An environment for telecollaborative data exploration
VIS '93 Proceedings of the 4th conference on Visualization '93
Selected AI-Related Dissertations
ACM SIGART Bulletin
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