The Test Requirements Model (TeRM) Communicating Test Information Throughout the Product Life Cycle

Authors:
Lee A. Shombert;Danny C. Davis;Eric M. Bukata
Affiliations:
-;-;-
Venue:
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Year:
1999

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Abstract

Test information that is necessary to properlyverify product functionality and performance andisolate faults is collected throughout the product lifecycle. Unfortunately, this information is seldom capturedin a format that can be reused at subsequentlife-cycle stages. This paper describes a formalinformation-based methodology, called the Test RequirementsModel (TeRM) that can be shown to facilitatethe transfer of test-related product informationbetween various stages of the life cycle and tohigher-level assemblies in a system (including embeddedcores in integrated circuits.)