Visualizing polycrystalline orientation microstructures with spherical color maps

Authors:
Boris Yamrom;John A. Sutliff;Andrew P. Woodfield
Affiliations:
GE Corporate Research and Development, Schenectady, New York;GE Corporate Research and Development, Schenectady, New York;GE Aircraft Engine, Cincinnati, Ohio
Venue:
VIS '94 Proceedings of the conference on Visualization '94
Year:
1994

Citing 3
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Abstract

Spherical color maps can be an effective tool in the microstructure visualization of polycrystals. Electron backscatter diffraction pattern analysis provides large arrays of the orientation data that can be visualized easily using the technique described in this paper. A combination of this technique with the traditional black and white scanning electron microscopy imaging will enable scientists to better understand the correlation between material properties and their polycrystalline structure.