Model-based fault diagnosis of sequential circuits and its acceleration

Authors:
Benjamin Rogel-Favila;Antony Wakeling;Peter Ying Kay Cheung
Affiliations:
Imperial College of Science, London, UK.;Schlumberger Technologies, Ferndown Industrial Estate, Wimborne, Dorset, UK.;Imperial College of Science, London, UK.
Venue:
EURO-DAC '91 Proceedings of the conference on European design automation
Year:
1991

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Abstract

This paper describes an algorithm for the location of faulty components in digital circuits using the model-based approach to circuit fault diagnosis. The model-based approach is first extended to apply to synchronous sequential circuits. Acceleration strategies that exploit domain knowledge particular to digital circuits are then proposed. The effect of these acceleration strategies is a drastic reduction in the execution time of the diagnosis procedure. The effectiveness and performance of the diagnosis algorithm are illustrated through an example for which encouraging results are obtained.