The worst-case chip problem

Authors:
Laurent Alonso;Philippe Chassaing;Edward M. Reingold;René Schott
Affiliations:
INRIA-Lorraine and LORIA, Université Henri Poincaré-Nancy, BP 239, 54506 Vandoeuvre-lès-Nancy, France;Institut Élie Cartan, Université Henri Poincaré-Nancy 1, BP 239, 54506 Vandæuvre-lès-Nancy, France;Department of Computer Science, University of Illinois at Urbana-Champaign, 1304 W. Springfield Avenue, Urbana, IL and Department of Computer Science, Illinois Institute of Technology, Smart Build ...;Institut Élie Cartan and LORIA, Université Henri Poincaré-Nancy 1, BP 239, 54506 Vandæuvre-lès-Nancy, France
Venue:
Information Processing Letters
Year:
2004

Citing 6
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Parallel fault identification algorithm

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Reliable Fault Diagnosis with Few Tests

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Abstract

In the system level, adaptive fault diagnosis problem we must determine which components (chips) in a system are defective, assuming the majority of them are good. Chips are tested as follows: Take two chips, say x and y, and have x report whether y is good or bad. If x is good, the answer is correct, but if x is bad, the answer is unreliable. One way to identify all defective chips is to identify a single good chip which can then be used to diagnose the other chips; the chip problem is to identify a single good chip. We show that the chip problem is closely related to a modified majority problem in the worst case and use this fact to obtain upper and lower bounds on algorithms for the chip problem.