Testing Systems Wirelessly

Authors:
Hans Eberle;Arvinderpal Wander;Nils Gura
Affiliations:
-;-;-
Venue:
VTS '04 Proceedings of the 22nd IEEE VLSI Test Symposium
Year:
2004

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Abstract

Wired test structures exhibit many unwanted dependencies:They typically use hierarchical and daisy-chainedwiring, and they share interconnects and backplanes withthe system under test. As a result, faults can easily leadto incomplete or erroneous test reports on properly workingcomponents. Wireless test structures do not have theseshortcomings and, thus, allow for more accurate testingand diagnosing. Wireless communication further allows fornon-intrusive testing that does not require any cabling orphysical access to the system under test.We describe two prototype implementations: a wirelessfield-replaceable unit ID and a wireless version of the popularJTAG standard.