CAD-Based Computer Vision: From CAD Models to Relational Graphs
IEEE Transactions on Pattern Analysis and Machine Intelligence
Aspect-trees: generation and interpretation
Computer Vision and Image Understanding
Computing Occlusion-Free Viewpoints
IEEE Transactions on Pattern Analysis and Machine Intelligence
A Viewpoint Planning Strategy for Determining True Angles on Polyhedral Objects by Camera Alignment
IEEE Transactions on Pattern Analysis and Machine Intelligence
The Automatic Construction of a View-Independent Relational Model for 3-D Object Recognition
IEEE Transactions on Pattern Analysis and Machine Intelligence
Informative Views and Sequential Recognition
ECCV '96 Proceedings of the 4th European Conference on Computer Vision-Volume I - Volume I
Recognition and Pose Determinatn of 3-D Objects Using Multiple Views
CAIP '95 Proceedings of the 6th International Conference on Computer Analysis of Images and Patterns
Obtaining complete 2½D view representation of polyhedra using concept of seedling single-view area
Computer Vision and Image Understanding
Machine Graphics & Vision International Journal
Generating 3D multiview exact polyhedron representation by scanning faces surroundings
Machine Graphics & Vision International Journal
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This paper is the second part of our study describing methods for obtaining a 3D multiview exact and complete model of convex polyhedra used for visual identification. Non-iterative methods, like the iterative ones [21], explore the concept of the view sphere with perspective projection and the view sphere covering as a mechanism for representation completeness.The non-iterative methods ([19]) consist in calculating a view, determining the corresponding single-view area (the so-called seedling single-view area) and then searching for the neighbouring single-view areas (generating the views at the same time) in a spiral way until the whole view sphere is covered by the latter. Having a complete set of the single-view areas (complete view sphere covering), we get a complete set of views as well.Test results and computational complexity estimation are also included.