Spatial pattern discovery by learning a probabilistic parametric model from multiple attributed relational graphs

Authors:
Pengyu Hong;Thomas S. Huang
Affiliations:
Science Center 601, Harvard University, 1 Oxford Street, Cambridge, MA;Beckman Institute for Advanced Science and Technology, University of Illinois at Urbana-Champaign, Urbana, IL
Venue:
Discrete Applied Mathematics - The 2001 international workshop on combinatorial image analysis (IWCIA 2001)
Year:
2004

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Abstract

This paper presents the methodology and theory for automatic spatial pattern discovery from multiple attributed relational graph samples. The spatial pattern is modelled as a mixture of probabilistic parametric attributed relational graphs. A statistic learning procedure is designed to learn the parameters of the spatial pattern model from the attributed relational graph samples. The learning procedure is formulated as a combinatorial non-deterministic process, which uses the expectation-maximization (EM) algorithm to find the maximum-likelihood estimates for the parameters of the spatial pattern model. The learned model summarizes the samples and captures the statistic characteristics of the appearance and structure of the spatial pattern, which is observed under various conditions. It can be used to detect the spatial pattern in new samples. The proposed approach is applied to unsupervised visual pattern extraction from multiple images in the experiments.