Fault Modeling and Simulation of Power Supply Voltage Transients in Digital Systems on a Chip
Journal of Electronic Testing: Theory and Applications
ACM Transactions on Embedded Computing Systems (TECS)
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In this paper, we propose a novel on-chip circuit to measurethe jitter present at the output of Phase-Locked-Loops(PLLs) used for synthesizing a clock with equal or higherfrequency than the input clock.This measure is performedat every period of the ...