Finite-element solution of the semiconductor transport equations
Proc. of the sixth int'l. symposium on Computing methods in applied sciences and engineering, VI
A method of interactive visualization of CAD surface models on a color video display
SIGGRAPH '81 Proceedings of the 8th annual conference on Computer graphics and interactive techniques
The theory, design, implementation and evaluation of a three-dimensional surface detection algorithm
SIGGRAPH '80 Proceedings of the 7th annual conference on Computer graphics and interactive techniques
Visual interpretation of complex data
IBM Systems Journal
Visual interpretation of multidimensional computations and transistor design
IBM Journal of Research and Development
Application of visualization tools in solid mechanics
IBM Journal of Research and Development
Numerical modeling of advanced semiconductor devices
IBM Journal of Research and Development
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The increasing complexity of digital simulations requires more effective techniques to display and interpret the voluminous outputs. Advanced digital processing workstations and high-resolution color monitors permit a wide range of new techniques for use in examining the global characteristics of each output variable and their interrelationships with other variables. In this investigation, animation, 3D display, and multiple-window imaging have been shown to be effective in interpreting multiple-variable data sets, both scalar and vector. These display methods are used in the solution of two specific semiconductor design problems: the avalanche breakdown of an n-MOSFET and an alpha particle hit on an npn transistor. With these techniques the user can more fully utilize the results of these long and costly computations, making these methods a powerful addition to existing techniques for imaging data.