An Efficient Automatic Redeye Detection and Correction Algorithm

  • Authors:
  • Huitao Luo;Jonathan Yen;Dan Tretter

  • Affiliations:
  • Hewlett-Packard Labs, Palo Alto, CA;Hewlett-Packard Labs, Palo Alto, CA;Hewlett-Packard Labs, Palo Alto, CA

  • Venue:
  • ICPR '04 Proceedings of the Pattern Recognition, 17th International Conference on (ICPR'04) Volume 2 - Volume 02
  • Year:
  • 2004

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Abstract

A fully automatic redeye detection and correction algorithm is presented to address the redeye artifacts in digital photos. The algorithm contains a redeye detection part and a correction part. The detection part is modeled as a feature based object detection problem. Adaboost is used to simultaneously select features and train the classifier. A new feature set is designed to address the orientation-dependency problem associated with the Haar-like features commonly used for object detection design. For each detected redeye, a correction algorithm is applied to do adaptive desaturation and darkening over the redeye region.