A Level-Crossing Approach for the Analysis of RF Modulated Signals Using Only Digital Test Resources
Journal of Electronic Testing: Theory and Applications
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A dynamic analog test methodology using digital tester is proposed. A simple triangular waveform is built on the device interface board for the stimulus generation. The response waveform is quantized by the dual comparators in a digital pin electronic circuit. . Statistical analysis is conducted to enhance the quantization resolution and minimize the noise effect. The experimental results using an ATE show that the error is less than 2%. It confirms the feasibility of the proposed methodology.