Smart Temperature Sensor for Thermal Testing of Cell-Based ICs

  • Authors:

  • S. A. Bota;M. Rosales;J. L. Rossello;J. Segura

  • Affiliations:

  • Universitat de les Illes Balears, Spain;Universitat de les Illes Balears, Spain;Universitat de les Illes Balears, Spain;Universitat de les Illes Balears, Spain

  • Venue:
  • Proceedings of the conference on Design, Automation and Test in Europe - Volume 1
  • Year:
  • 2005

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Abstract

In this paper we present a simple and efficient built-in temperature sensor for thermal monitoring of standard-cell based VLSI circuits.The proposed smart temperature sensor uses a ring-oscillator composed of complex gates instead of inverters to optimize their linearity.Simulation results from a 0.18驴m CMOS technology show that the non-linearity error of the sensor can be reduced when an adequate set of standard logic gates is selected.