New Schemes for Self-Testing RAM

  • Authors:

  • Gh. Bodean;D. Bodean;A. Labunetz

  • Affiliations:

  • Technical University of Moldova;Technical University of Moldova;Technical University of Moldova

  • Venue:
  • Proceedings of the conference on Design, Automation and Test in Europe - Volume 2
  • Year:
  • 2005

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Abstract

This paper gives an overview of a new technique, named pseudo-ring testing (PRT). PRT can be applied for testing wide type of random access memories (RAM): bit- or word-oriented and single- or dual-port RAM's. An essential particularity of the proposed methodology is the emulation of a linear automaton over Galois field by memory own components.