Convolutional Compaction-Driven Diagnosis of Scan Failures

Authors:
Grzegorz Mrugalski;Artur Pogiel;Janusz Rajski;Jerzy Tyszer;Chen Wang
Affiliations:
Mentor Graphics Corporation;Poznań University of Technology;Mentor Graphics Corporation;Poznań University of Technology;Mentor Graphics Corporation
Venue:
ETS '05 Proceedings of the 10th IEEE European Symposium on Test
Year:
2005

Citing 0
Cited 1

Isolation of Failing Scan Cells through Convolutional Test Response Compaction

Journal of Electronic Testing: Theory and Applications

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Abstract

An unified gate-level fault model for interconnect opens and bridges is proposed. Defects are modeled as constrained multiple line stuck-at faults. A novel feature of the proposed fault model is its flexibility to accommodate increasing levels of accuracy. ...