Isolation of Failing Scan Cells through Convolutional Test Response Compaction

Authors:
Grzegorz Mrugalski;Janusz Rajski;Chen Wang;Artur Pogiel;Jerzy Tyszer
Affiliations:
Mentor Graphics Corporation, Wilsonville, USA 97070;Mentor Graphics Corporation, Wilsonville, USA 97070;Mentor Graphics Corporation, Wilsonville, USA 97070;Poznań University of Technology, Poznań, Poland 60-965;Poznań University of Technology, Poznań, Poland 60-965
Venue:
Journal of Electronic Testing: Theory and Applications
Year:
2007

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Abstract

This paper describes a non-recursive fault diagnosis technique for scan-based designs with convolutional test response compaction. The proposed approach allows a time-efficient and accurate identification of failing scan cells using Gauss---Jordan elimination method.