An Efficient Scheme to Diagnose Scan Chains

A Technique for Fault Diagnosis of Defects in Scan Chains

ITC '01 Proceedings of the 2001 IEEE International Test Conference

Intermittent Scan Chain Fault Diagnosis Based on Signal Probability Analysis

Proceedings of the conference on Design, automation and test in Europe - Volume 2

Diagnosis of Multiple Hold-Time and Setup-Time Faults in Scan Chains

IEEE Transactions on Computers

Quick Scan Chain Diagnosis Using Signal Profiling

ICCD '05 Proceedings of the 2005 International Conference on Computer Design

Using fault model relaxation to diagnose real scan chain defects

Proceedings of the 2005 Asia and South Pacific Design Automation Conference

Isolation of Failing Scan Cells through Convolutional Test Response Compaction

Journal of Electronic Testing: Theory and Applications

Dynamic learning based scan chain diagnosis

Proceedings of the conference on Design, automation and test in Europe

Diagnosis, modeling and tolerance of scan chain hold-time violations

Proceedings of the conference on Design, automation and test in Europe

A versatile paradigm for scan chain diagnosis of complex faults using signal processing techniques

ACM Transactions on Design Automation of Electronic Systems (TODAES)

A design-for-diagnosis technique for diagnosing both scan chain faults and combinational circuit faults

Proceedings of the 2008 Asia and South Pacific Design Automation Conference

S/390 G5 CMOS microprocessor diagnostics

IBM Journal of Research and Development

DiSC: a new diagnosis method for multiple scan chain failures

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Scan chain hold-time violations: can they be tolerated

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Diagnosis of single stuck-at faults and multiple timing faults in scan chains

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Diagnosing scan clock delay faults through statistical timing pruning

Proceedings of the 48th Design Automation Conference

Fault Diagnosis with Orthogonal Compactors in Scan-Based Designs

Journal of Electronic Testing: Theory and Applications

An ATE assisted DFD technique for volume diagnosis of scan chains

Proceedings of the 50th Annual Design Automation Conference