Diagnosis of Scan Cells in BIST Environment

Authors:
Janusz Rajski;Jerzy Tyszer
Affiliations:
Mentor Graphics Corp., Wilsonville, OR;Poznan Univ. of Technology, Poznan, Poland
Venue:
IEEE Transactions on Computers
Year:
1999

Citing 7
Cited 13

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A Partition-Based Approach for Identifying Failing Scan Cells in Scan-BIST with Applications to System-on-Chip Fault Diagnosis

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The Construction of Optimal Deterministic Partitionings in Scan-Based BIST Fault Diagnosis: Mathematical Foundations and Cost-Effective Implementations

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Isolation of Failing Scan Cells through Convolutional Test Response Compaction

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Fault Diagnosis with Orthogonal Compactors in Scan-Based Designs

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Abstract

The paper presents a new fault diagnosis technique for scan-based designs with BIST. It can be used for nonadaptive identification of the scan cells that are driven by erroneous signals. The proposed scheme employs a pseudorandom scan cell selection routine which, in conjunction with a conventional signature analysis and simple reasoning procedure, allows flexible trade-offs between the test application time and the diagnostic resolution.