Improved fault diagnosis in scan-based BIST via superposition

Authors:
Ismet Bayraktaroglu;Alex Orailoğlu
Affiliations:
Computer Science & Engineering Department, University of California, San Diego, La Jolla, CA;Computer Science & Engineering Department, University of California, San Diego, La Jolla, CA
Venue:
Proceedings of the 37th Annual Design Automation Conference
Year:
2000

Citing 2
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Abstract

An improved approach for diagnosis of scan-based BIST designs is proposed. The enhancement in diagnosis is achieved by utilizing the superposition principle. Scan cells are partitioned pseudorandomly for observation and the ones provably fault free are removed from the potentially faulty list. Diagnostic resolution is improved by a novel application of the superposition principle, resulting in significant reductions in diagnosis time.