Deterministic Partitioning Techniques for Fault Diagnosis in Scan-Based BIST

Authors:
Ismet Bayraktaroglu;Alex Orailoglu
Affiliations:
-;-
Venue:
ITC '00 Proceedings of the 2000 IEEE International Test Conference
Year:
2000

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Abstract

A deterministic partitioning technique for fault diagnosisin Scan-Based BIST is proposed. Properties of high qualitypartitions for improved fault diagnosis times are identifiedand low cost hardware implementations of high quality deterministic partitions are outlined. The superiority of thepartitions generated by the proposed approach is confirmedthrough mathematical analysis. Theoretical analyses, worstcase bounds, and experimental simulation data all confirmthe superiority of the proposed deterministic approaches.