Diagnosis for scan-based BIST: reaching deep into the signatures

Diagnosis of Scan Cells in BIST Environment

IEEE Transactions on Computers

Improved fault diagnosis in scan-based BIST via superposition

Proceedings of the 37th Annual Design Automation Conference

Deterministic Partitioning Techniques for Fault Diagnosis in Scan-Based BIST

ITC '00 Proceedings of the 2000 IEEE International Test Conference

Improving the efficiency of error identification via signature analysis

VTS '95 Proceedings of the 13th IEEE VLSI Test Symposium

Fault Diagnosis in Scan-Based BIST Using Both Time and Space Information

ITC '99 Proceedings of the 1999 IEEE International Test Conference

Scan-based BIST fault diagnosis

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems